Chairmen: Maximilian Haider and Davor Pavuna
0900-0930
Scanning Transmission Electron Microscopy at Atomic Resolution
Ferdinand Hofer, Gerald Kothleitner
Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, A-8010 Graz, Austria
0930-1000
Defects in the TEM
C. Barry Carter
Dept of Chem. & Biomolec. Engng, U. of Connecticut, 191 Auditorium Rd, Storrs, CT USA; Dept of Mats Sci & Engng, U. of Connecticut, 97 North Eagleville Road, Storrs, CT USA; Institute of Materials Science, U. of Connecticut, 97 North Eagleville Road, Storrs, CT USA
1000-1030
Structure and Properties of Dislocations in Bilayer Graphene
Erdmann Spiecker
Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), University of Erlangen-Nürnberg, Cauerstrasse 6, D-91058 Erlangen, Germany
1030-1100
Advances in Focused Ion Beam Imaging, Spectroscopy and Fabrication
Robert Hull
Rensselaer Polytechnic Institute, Troy NY, USA
Break: 1100-1130